ATOMIC FORCE MICROSCOPY [Copy]

ATOMIC FORCE MICROSCOPY [Copy]

Published on 4 June 2021
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Transcript
00:02
PRINCIPLE OPERATION
00:05
The AFM is made up of a cantilever with a sharp tip (probe) that is used to scan the surface of the material. Silicon or silicon nitride cantilevers with a tip radius of curvature on the order of nano meters are commonly used
00:14
Hooke's law states that when the tip comes into contact with a sample surface, forces between the tip and the sample cause the cantilever to deflect
00:19
The AFM is made up of a cantilever with a sharp tip (probe) that is used to scan the surface of the material . Silicon or silicon nitride cantilevers with a tip radius of curvature on the order nano meters are commonly used