The AFM is made up of a cantilever with a sharp tip (probe) that is used
to scan the surface of the material. Silicon or silicon nitride cantilevers with
a tip radius of curvature on the order of nano meters are commonly used
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Hooke's law states that when the tip comes into contact with a
sample surface, forces between the tip and the sample cause
the cantilever to deflect
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The AFM is made up of a cantilever with a sharp tip (probe) that is used
to scan the surface of the material . Silicon or silicon nitride cantilevers with a tip radius
of curvature on the order nano meters are commonly used